Click image to view full sizeEM4SYS - Nano Xpert II
EM4SYS - Nano Xpert II
Nano Xpert II Atomic Force Microscopy (AFM)
The personalized desktop AFM system can be used with probes from various manufacturers, which is small in size and does not take up space. The modular software and hardware design is equipped with a fast calibration program, which can be easily used by beginners.
Simple operation procedure
Magnetic suction probe holder, with high magnification microscope and high resolution observation camera, non-professional operators can quickly perform laser signal calibration.
High-resolution image
The XY-axis scanning controller provides two options of VCM type and PZT type. The maximum scanning range is 200mm × 200mm (VCM type, optional), and the highest resolution is 0.2nm. Equipped with PZT type scanning controller in Z axis direction, the maximum scanning range is 7 mm, and the resolution can reach 0.02nm. An optional 30mm × 30mm electric translation stage is also available to enhance the convenience of operation.
Integrated operating software
Provide Contact, NonCantact, Tapping and Lateral Force measurement modes. Intuitive software operation interface, you can start scanning with simple parameter settings. In addition, AFM analysis software is integrated to provide fast image processing and data analysis.
Operating software:
application:
